Nihon Micro Coating Co., Ltd. Probe card cleaning sheet
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Probe card cleaning sheet

 

The probe card is used during the semiconductor wafer inspection process; after a certain period of use, the needles must be cleaned to maintain their optimum performance.
In response to the recent progress of semiconductor performance, needles are diversifying and the pitch is becoming smaller.
The importance of this cleaning sheet is only increasing as it is a key factor in prolonging the life of these expensive probe cards; we offer the very best cleaning sheets for the probe card and have an enviable track record with many semiconductor manufactures.

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Probe card cleaning sheet
Feature
Less-abrasive cleaning
Suitable for a variety of needles
Heat resistance
Can be easily applied on wafer or stage

Sheet structure

MIPOX Cleaning sheets are coated with abrasive particles on each base materials.
Please contact us for more information.


Line up

TYPE
Abrasive
Color
Features
PET TYPE
WA4000
Yellow
·Suitable for tip head cleaning
·Great cleaning performance
·Good for flat tip cleaning
WA6000
White
WA8000
Light Pink
GC6000
Gray
PF3 TYPE
GC4000
Gray

·Suitable for tip head cleaning, less damage on tips
·Good for flap tip cleaning
·Heat resistant up to 130C

GC6000
Gray
GC8000
Brown
SI10000
Orange
SWE TYPE
WA4000
Yellow

·Suitable for tip head cleaning, less damage on tips
·Suitable for both round and crown shape tips.

WA6000
Green
WA8000
Pink
WA10000
Orange
SI10000
Orange
ASE TYPE
-
Gray
·Damage-free cleaning
·Suitable for tip-side cleaning
·Heat resistant (-30C~160C)
·Easily applied on wafer
BC3 TYPE
GC4000
Gray
·Suitable for tip head cleaning, less damage on tips
·Good for flap tip cleaning(alloy system cantilever)
GC6000
Gray
GC8000
Gray
GC10000
Gray

Size

Sheet type(mm)
Disk type(mm) φ
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136×149

50

150×150 152
152×152 194
222×149 203
228×280 194-FO
  290
*Please contact us for other sizes
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